Fluke Corporation MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 8021B: (2 year) CAL VER /5100,8842 INSTRUMENT: Fluke 8022B: (2 year) CAL VER /5100,8842 DATE: 10-Feb-95 AUTHOR: Fluke Corporation REVISION: $Revision: 2.7 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 29 NUMBER OF LINES: 178 CONFIGURATION: Fluke 5100B CONFIGURATION: Fluke 8842A ============================================================================= # # Source: # Fluke 8021B instruction manual (PN 616037 July 1981). # Fluke 8022B instruction manual (PN 616045 July 1981). # # Compatibility: # MET/CAL 4.0 or later # # Subprocedures: # None # # Required Files: # 51_COMP1.bmp # 51_V8021.bmp # 51DV8021.bmp # 51_A8021.bmp # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5100B accuracy file contains 6 month specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 6 month specifications of the 5100B are used in TUR computations. # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- P F V 1.002 ASK+ K 1.003 HEAD EQUIPMENT SETUP 1.004 DISP [32] WARNING 1.004 DISP HIGH VOLTAGE is used or exposed during the performance 1.004 DISP of this calibration. DEATH ON CONTACT may result if 1.004 DISP personnel fail to observe safety precautions. 1.005 DISP Ambient temperature: 21C - 25C. 1.005 DISP Relative humidity: less than 80%. 1.005 DISP Allow the UUT to stabilize. 1.006 DISP Turn on UUT. 1.007 ASK- N U 1.008 HEAD RESISTANCE TESTS (Test Lead Compensation) 1.009 PIC 51_COMP1 1.010 IEEE [@8842]G5[I] 1.011 MATH MEM1 = MEM - 1100 1.012 JMPF 1.015 1.013 DISP Select FRONT INPUTS on the 8842A. 1.014 JMP 1.010 1.015 RESF 100Z S 2W 1.016 8842 100Z N 4W 1.017 MATH M[1] = MEM 1.018 RESF 1kZ S 2W 1.019 8842 1kZ N 4W 1.020 MATH M[2] = MEM 1.021 RESF 10kZ S 2W 1.022 8842 10kZ N 4W 1.023 MATH M[3] = MEM 1.024 RESF * S 1.025 HEAD {RESISTANCE TESTS} 1.026 HEAD RESISTANCE TEST: {2 kOhm Range} 1.027 RNG 2kZ 1.028 DISP Short the V Ohm S and COMMON inputs together. 1.029 ASK- U 1.030 ACC 0.000kZ TOL 1.031 MEMI Enter UUT reading in kilohms: 1.032 MEME 1.033 MEMC 2 kZ +0.001U 2.001 HEAD RESISTANCE TEST: {200 Ohm Range} 2.002 RNG 200Z 2.003 ASK- U 2.004 ACC 0.0Z TOL 2.005 MEMI Enter UUT reading in ohms: 2.006 MEME 2.007 MEMC 200 Z +0.2U 3.001 DISP Remove the short. 3.002 PIC 51_V8021 3.003 RESF 100.0Z S 2W 3.004 ASK+ N U 3.005 MATH MEM = M[1] # 8842A 90 day accuracy, 200 Ohm Range 3.006 ACC 100 Z 0.007% 0.004U 3.007 MEMI Enter UUT reading in Ohms: 3.008 MEME 3.009 MEMC 200 Z 0.5U 4.001 ASK- U 4.002 HEAD RESISTANCE TESTS: {2 kOhm Range} 4.003 RNG 2kZ 4.004 RESF 1.000kZ S 2W 4.005 ASK+ U 4.006 MATH MEM = M[2] # 8842A 90 day accuracy, 2 kOhm Range 4.007 ACC 1 kZ .005% .00003U 4.008 MEMI Enter UUT reading in kilohms: 4.009 MEME 4.010 MEMC 2 kZ 0.2% 0.001U 5.001 ASK- U 5.002 HEAD RESISTANCE TESTS: {20 kOhm Range} 5.003 RNG 20kZ 5.004 RESF 10.00kZ S 2W 5.005 ASK+ U 5.006 MATH MEM = M[3] # 8842A 90 day accuracy, 20 kOhm Range 5.007 ACC 10 kZ .005% .0003U 5.008 MEMI Enter UUT reading in kilohms: 5.009 MEME 5.010 MEMC 20 kZ 0.2% 0.01U 6.001 HEAD RESISTANCE TESTS: {200 kOhm Range} 6.002 RESF 200 100.0kZ 0.2% 0.1U 2W 7.001 HEAD RESISTANCE TESTS: {2000 kOhm Range} 7.002 RESF 2000 1000kZ 2.0% 1U 2W 8.001 HEAD RESISTANCE TESTS: {20 MOhm Range} 8.002 RESF 20 10.00MZ 2.0% 0.01U 2W 9.001 JMPT 1.002 Fluke 8022B: (2 year) CAL VER /5100,8842 9.002 DISP Disconnect the 5100B from the UUT. 9.003 HEAD {CONTINUITY TEST AUDIBLE TONE} 9.004 RNG 2kZ 9.005 DISP Short the V Ohm S and COMMON terminals together. 9.006 DISP Depress the AC/DC switch to activate the audible tone. 9.007 EVAL Is there an {audible tone}? 10.001 DISP Remove the short. 10.002 PIC 51_V8021 10.003 5100 110V 60H S 2W 10.004 EVAL Verify a {beep rate of approximately 5 to 10 per sec}. 11.001 HEAD {DC VOLTAGE TESTS} 11.002 HEAD DC VOLTAGE TESTS: {200mV Range} 11.003 5100 200 190.0mV 0.25% 0.1U 2W 12.001 5100 200 -190.0mV 0.25% 0.1U 2W 13.001 HEAD DC VOLTAGE TESTS: {2V Range} 13.002 5100 2 0.000V 0.001U 2W 14.001 5100 2 1.900V 0.25% 0.001U 2W 15.001 HEAD DC VOLTAGE TESTS: {20V Range} 15.002 5100 20 19.00V 0.25% 0.01U 2W 16.001 HEAD DC VOLTAGE TESTS: {200V Range} 16.002 5100 200 190.0V 0.25% 0.1U 2W 17.001 HEAD DC VOLTAGE TESTS: {1000V Range} 17.002 5100 1000 1000V 0.25% 1U 2W 18.001 DISP Disconnect the 5100B from the UUT. 18.002 HEAD {AC VOLTAGE TESTS} 18.003 HEAD AC VOLTAGE TESTS: {200mV Range} 18.004 PIC 51DV8021 18.005 DISP Disconnect the AC Divider from the 5100B and UUT. 18.006 5100 200 19.0mV 1.0% 0.3U 100H 2W 19.001 PIC 51_V8021 19.002 5100 0.0mV S 2W 19.003 MEMI Enter UUT reading in volts AC: 19.004 MEME 19.005 MEMC 200 mV +0.3U 20.001 5100 200 190.0mV 1.0% 0.3U 100H 2W 21.001 HEAD AC VOLTAGE TESTS: {2V Range} 21.002 5100 2 1.900V 1.0% 0.003U 100H 2W 22.001 HEAD AC VOLTAGE TESTS: {20V Range} 22.002 5100 20 19.00V 1.0% 0.03U 100H 2W 23.001 HEAD AC VOLTAGE TESTS: {200V Range} 23.002 5100 200 190.0V 1.0% 0.3U 100H 2W 24.001 HEAD AC VOLTAGE TESTS: {750V Range} 24.002 5100 750 750V 1.0% 3U 400H 2W 25.001 HEAD {DC CURRENT TESTS} 25.002 HEAD DC CURRENT TESTS: {2mA Range} 25.003 PIC 51_A8021 25.004 5100 2 1.900mA 0.75% 0.001U 2W 26.001 HEAD DC CURRENT TESTS: {20mA Range} 26.002 5100 20 -19.00mA 0.75% 0.01U 2W 27.001 HEAD DC CURRENT TESTS: {200mA Range} 27.002 5100 200 190.0mA 0.75% 0.1U 2W 28.001 HEAD DC CURRENT TESTS: {2000mA Range} 28.002 5100 2000 1900mA 0.75% 1U 2W 29.001 END